Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy

G. Naresh-Kumar, P. R. Edwards, T. Batten, M. Nouf-Allehiani, A. Vilalta-Clemente, A. J. Wilkinson, E. Le Boulbar, P. A. Shields, B. Starosta, B. Hourahine, R. W. Martin, C. Trager-Cowan

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Data for: "Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy"
Gunasekar, N. (Creator), Edwards, P. (Contributor), Martin, R. (Contributor), Trager-Cowan, C. (Contributor), Hourahine, B. (Contributor), Starosta, B. (Contributor), Nouf-Allehiani, M. (Contributor), Batten, T. (Contributor), Vilalta-Clemente, A. (Contributor), Wilkinson, A. (Contributor), Shields, P. A. (Contributor) & Le Boulbar, E. D. (Contributor), University of Strathclyde, 31 Jan 2022
DOI: 10.15129/659ff01d-e5e0-4868-aaf2-1f3d656f5db3
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