Abstract
Dielectronic recombination rate coefficients are computed for the Si-like isoelectronic sequence, focusing on the near-threshold resonances of S2+.
| Language | English |
|---|---|
| Article number | 052074 |
| Number of pages | 1 |
| Journal | Journal of Physics: Conference Series |
| Volume | 635 |
| Issue number | 5 |
| Early online date | 7 Sep 2015 |
| DOIs | |
| Publication status | E-pub ahead of print - 7 Sep 2015 |
| Event | XXIX International Conference on Photonic, Electronic, and Atomic Collisions (ICPEAC) - Toledo, Spain Duration: 22 Jul 2015 → 28 Jul 2015 |
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Keywords
- atoms
- dielectronic recombinations
- isoelectronic sequence
- near thresholds
- electron resonance
Cite this
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Near-threshold dielectronic recombination studies of Si-like ions. / Kaur, J.; Gorczyca, T. W.; Badnell, N. R.
In: Journal of Physics: Conference Series , Vol. 635, No. 5, 052074, 07.09.2015.Research output: Contribution to journal › Conference Contribution
TY - JOUR
T1 - Near-threshold dielectronic recombination studies of Si-like ions
AU - Kaur, J.
AU - Gorczyca, T. W.
AU - Badnell, N. R.
PY - 2015/9/7
Y1 - 2015/9/7
N2 - Dielectronic recombination rate coefficients are computed for the Si-like isoelectronic sequence, focusing on the near-threshold resonances of S2+.
AB - Dielectronic recombination rate coefficients are computed for the Si-like isoelectronic sequence, focusing on the near-threshold resonances of S2+.
KW - atoms
KW - dielectronic recombinations
KW - isoelectronic sequence
KW - near thresholds
KW - electron resonance
UR - http://www.scopus.com/inward/record.url?scp=84948823182&partnerID=8YFLogxK
UR - http://iopscience.iop.org/1742-6596
UR - http://www.icpeac2015.com/
U2 - 10.1088/1742-6596/635/5/052074
DO - 10.1088/1742-6596/635/5/052074
M3 - Conference Contribution
VL - 635
JO - Journal of Physics: Conference Series
T2 - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 5
M1 - 052074
ER -