Abstract
In this editorial nanometrology is defined and discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 95-96 |
| Number of pages | 1 |
| Journal | Analyst |
| Volume | 132 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2007 |
Keywords
- nanometrology
- measurement
- electron microscopy
- fluorescence resonance energy transfer
- FRET
- nanotechnology
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