MV cable lifetime improvement analysis through transformer tap changes

Bojie Sheng, Faisal Peer Mohamed, Wah Hoon Siew, Brian G Stewart

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

Abstract

Cable life depends mainly on the thermal stress, which relates to the current applied on the cable. Voltage changes in medium voltage (MV) cables due to transformer tap changes will also change the current flowing through the cable, which will change the cable temperature. In order to extend the cable life, this paper aims to simulate and analyse the potential thermal lifetime improvement of cables through long-term tap changes within the statutory levels. Firstly, the IEC standard (60287) method for rating and modelling cables is applied to evaluate the cable temperature under different voltages and relative currents. Different cable configurations will also be considered in simulations as temperature is dependent on the cable dimensions. Then, typical thermal lifetime analytical expressions will be used to evaluate the long-term influence of voltage changes. Lastly, the obtained thermal lifetime assessments under different transformer tap changes and different cable configurations will provide a potential understanding of cable lifetime changes through implementation of permitted regulatory voltage changes.
LanguageEnglish
Title of host publication2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Place of PublicationPiscataway, N.J.
Pages177-180
Number of pages4
DOIs
Publication statusPublished - 15 Jan 2018

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Cables
Electric potential
Thermal stress
Temperature

Keywords

  • cable life
  • voltange changes
  • medium voltage cables
  • energy demand

Cite this

Sheng, B., Peer Mohamed, F., Siew, W. H., & Stewart, B. G. (2018). MV cable lifetime improvement analysis through transformer tap changes. In 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena (pp. 177-180). Piscataway, N.J.. https://doi.org/10.1109/CEIDP.2017.8257548
Sheng, Bojie ; Peer Mohamed, Faisal ; Siew, Wah Hoon ; Stewart, Brian G. / MV cable lifetime improvement analysis through transformer tap changes. 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena. Piscataway, N.J., 2018. pp. 177-180
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abstract = "Cable life depends mainly on the thermal stress, which relates to the current applied on the cable. Voltage changes in medium voltage (MV) cables due to transformer tap changes will also change the current flowing through the cable, which will change the cable temperature. In order to extend the cable life, this paper aims to simulate and analyse the potential thermal lifetime improvement of cables through long-term tap changes within the statutory levels. Firstly, the IEC standard (60287) method for rating and modelling cables is applied to evaluate the cable temperature under different voltages and relative currents. Different cable configurations will also be considered in simulations as temperature is dependent on the cable dimensions. Then, typical thermal lifetime analytical expressions will be used to evaluate the long-term influence of voltage changes. Lastly, the obtained thermal lifetime assessments under different transformer tap changes and different cable configurations will provide a potential understanding of cable lifetime changes through implementation of permitted regulatory voltage changes.",
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author = "Bojie Sheng and {Peer Mohamed}, Faisal and Siew, {Wah Hoon} and Stewart, {Brian G}",
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Sheng, B, Peer Mohamed, F, Siew, WH & Stewart, BG 2018, MV cable lifetime improvement analysis through transformer tap changes. in 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena. Piscataway, N.J., pp. 177-180. https://doi.org/10.1109/CEIDP.2017.8257548

MV cable lifetime improvement analysis through transformer tap changes. / Sheng, Bojie; Peer Mohamed, Faisal; Siew, Wah Hoon; Stewart, Brian G.

2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena. Piscataway, N.J., 2018. p. 177-180.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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N1 - © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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N2 - Cable life depends mainly on the thermal stress, which relates to the current applied on the cable. Voltage changes in medium voltage (MV) cables due to transformer tap changes will also change the current flowing through the cable, which will change the cable temperature. In order to extend the cable life, this paper aims to simulate and analyse the potential thermal lifetime improvement of cables through long-term tap changes within the statutory levels. Firstly, the IEC standard (60287) method for rating and modelling cables is applied to evaluate the cable temperature under different voltages and relative currents. Different cable configurations will also be considered in simulations as temperature is dependent on the cable dimensions. Then, typical thermal lifetime analytical expressions will be used to evaluate the long-term influence of voltage changes. Lastly, the obtained thermal lifetime assessments under different transformer tap changes and different cable configurations will provide a potential understanding of cable lifetime changes through implementation of permitted regulatory voltage changes.

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Sheng B, Peer Mohamed F, Siew WH, Stewart BG. MV cable lifetime improvement analysis through transformer tap changes. In 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena. Piscataway, N.J. 2018. p. 177-180 https://doi.org/10.1109/CEIDP.2017.8257548