Abstract
Recent developments in technology permit detailed descriptions of system performance to be collected and stored. Consequently, more data are available about the occurrence, or non-occurrence, of events across a range of classes through time. Typically this implies that reliability analysis has more information about the exposure history of a system within different classes of events. For highly reliable systems, there may be relatively few failure events. Thus there is a need to develop statistical inference to support reliability estimation when there is a low ratio of failures relative to event classes. In this paper we show how Empirical Bayes methods can be used to estimate a multivariate reliability function for a system by modelling the vector of times to realise each failure root cause.
Original language | English |
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Pages | 1-12 |
Number of pages | 12 |
Publication status | Unpublished - 17 Jul 2007 |
Event | ISSAT international conference on modeling of complex systems and environments - Ho Chi Minh City, Vietnam Duration: 16 Jul 2007 → 18 Jul 2007 |
Conference
Conference | ISSAT international conference on modeling of complex systems and environments |
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City | Ho Chi Minh City, Vietnam |
Period | 16/07/07 → 18/07/07 |
Keywords
- reliability growth model
- empirical Bayes
- engineering design process