Multi-channel high-linearity time-to-digital converters in 20 nm and 28 nm FPGAs for LiDAR applications

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

5 Downloads (Pure)

Abstract

This paper proposes a new calibration method, the mixed-binning method, to pursue a TDC with high linearity in field-programmable gate arrays (FPGAs). This method can reduce the nonlinearity caused by large clock skews in FPGAs efficiently. Therefore, a wide dynamic range tapped delay line (TDL) TDC has been developed with maintained linearity. We evaluated this method in Xilinx 20nm UltraScale FPGAs and Xilinx 28nm Virtex-7 FPGAs. Results conduct that this method is perfectly suitable for driverless vehicle applications which require high linearity with an acceptable resolution. The proposed method also has great potentials for multi-channel applications, due to the low logic resource consumption. For a quick proof-of-concept demonstration, an 8-channel solution has also been implemented. It can be further extended to a 64-channel version soon.
Original languageEnglish
Title of host publication2020 6th International Conference on Event-Based Control, Communication, and Signal Processing (EBCCSP)
Place of PublicationPiscataway, NJ
PublisherIEEE
Number of pages4
ISBN (Print)9781728195810
DOIs
Publication statusPublished - 25 Dec 2020
Event6th International Conference on Event-Based Control, Communication, and Signal Processing (EBCCSP)
-
Duration: 23 Sep 202025 Sep 2020
https://ebccsp2020.org/program/

Conference

Conference6th International Conference on Event-Based Control, Communication, and Signal Processing (EBCCSP)
Period23/09/2025/09/20
Internet address

Keywords

  • carry chains
  • field-programmable gate array (FPGA)
  • time of flight
  • time-to-digital converter (TDC)
  • automatic vehicle

Fingerprint

Dive into the research topics of 'Multi-channel high-linearity time-to-digital converters in 20 nm and 28 nm FPGAs for LiDAR applications'. Together they form a unique fingerprint.

Cite this