Microstructure instability in cryogenically deformed copper

T. Konkova; S. Mironov; A. Korznikov; S. L. Semiatin

doi:10.1016/j.scriptamat.2010.07.005

Microstructure instability in cryogenically deformed copper

T. Konkova, S. Mironov^*, A. Korznikov, S. L. Semiatin

^*Corresponding author for this work

Design, Manufacturing And Engineering Management

Research output: Contribution to journal › Article › peer-review

39 Citations (Scopus)

Abstract

High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth.

Original language	English
Pages (from-to)	921-924
Number of pages	4
Journal	Scripta Materialia
Volume	63
Issue number	9
Early online date	8 Jul 2010
DOIs	https://doi.org/10.1016/j.scriptamat.2010.07.005
Publication status	Published - 1 Nov 2010

Keywords

copper
cryogenic deformation
electron backscatter diffraction
nanocrystalline microstructure

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10.1016/j.scriptamat.2010.07.005

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@article{bbb1fae4e1734dd6b491c224ea0c2e0c,

title = "Microstructure instability in cryogenically deformed copper",

abstract = "High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth. ",

keywords = "copper, cryogenic deformation, electron backscatter diffraction, nanocrystalline microstructure",

author = "T. Konkova and S. Mironov and A. Korznikov and Semiatin, \{S. L.\}",

year = "2010",

month = nov,

day = "1",

doi = "10.1016/j.scriptamat.2010.07.005",

language = "English",

volume = "63",

pages = "921--924",

journal = "Scripta Materialia",

issn = "1359-6462",

publisher = "Acta Materialia Inc",

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TY - JOUR

T1 - Microstructure instability in cryogenically deformed copper

AU - Konkova, T.

AU - Mironov, S.

AU - Korznikov, A.

AU - Semiatin, S. L.

PY - 2010/11/1

Y1 - 2010/11/1

N2 - High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth.

AB - High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth.

KW - copper

KW - cryogenic deformation

KW - electron backscatter diffraction

KW - nanocrystalline microstructure

UR - https://www.scopus.com/pages/publications/77955982420

U2 - 10.1016/j.scriptamat.2010.07.005

DO - 10.1016/j.scriptamat.2010.07.005

M3 - Article

AN - SCOPUS:77955982420

SN - 1359-6462

VL - 63

SP - 921

EP - 924

JO - Scripta Materialia

JF - Scripta Materialia

IS - 9

ER -

Microstructure instability in cryogenically deformed copper

Abstract

Keywords

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