Microstructure instability in cryogenically deformed copper

T. Konkova, S. Mironov, A. Korznikov, S. L. Semiatin

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)


High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth. 
Original languageEnglish
Pages (from-to)921-924
Number of pages4
JournalScripta Materialia
Issue number9
Early online date8 Jul 2010
Publication statusPublished - 1 Nov 2010


  • copper
  • cryogenic deformation
  • electron backscatter diffraction
  • nanocrystalline microstructure


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