Method of testing electronic components

James B. Rosenzweig (Inventor), Bernhard Hidding (Inventor), Alex Murokh (Inventor)

Research output: Patent

Abstract

A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.
LanguageEnglish
Patent numberUS8947115B2
IPCUS8947115B2
Publication statusPublished - 3 Feb 2015

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radiation
electronics
plasma acceleration
nuclear power plants
photon beams
particle beams
void ratio
versatility
high altitude
flexibility
accelerators
neutrons
protons
sensitivity
photons
ions
electrons
interactions

Cite this

Rosenzweig, J. B., Hidding, B., & Murokh, A. (2015). IPC No. US8947115B2. Method of testing electronic components. (Patent No. US8947115B2).
Rosenzweig, James B. (Inventor) ; Hidding, Bernhard (Inventor) ; Murokh, Alex (Inventor). / Method of testing electronic components. IPC No.: US8947115B2. Patent No.: US8947115B2.
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abstract = "A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.",
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Rosenzweig, JB, Hidding, B & Murokh, A 2015, Method of testing electronic components, Patent No. US8947115B2, IPC No. US8947115B2.

Method of testing electronic components. / Rosenzweig, James B. (Inventor); Hidding, Bernhard (Inventor); Murokh, Alex (Inventor).

IPC No.: US8947115B2. Patent No.: US8947115B2.

Research output: Patent

TY - PAT

T1 - Method of testing electronic components

AU - Rosenzweig, James B.

AU - Hidding, Bernhard

AU - Murokh, Alex

PY - 2015/2/3

Y1 - 2015/2/3

N2 - A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.

AB - A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.

M3 - Patent

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ER -

Rosenzweig JB, Hidding B, Murokh A, inventors. Method of testing electronic components. US8947115B2. 2015 Feb 3.