TY - JOUR
T1 - Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL
AU - Khan, Nadir Ali
AU - Schires, Kevin
AU - Hurtado, Antonio
AU - Henning, Ian D.
AU - Adams, Michael J.
PY - 2013/11/13
Y1 - 2013/11/13
N2 - In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
AB - In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
KW - linewidth enhancement factor
KW - relaxation oscillation frequency (ROF)
KW - semiconductor lasers
KW - vertical-cavity surface-emitting lasers (VCSELs)
UR - https://www.scopus.com/pages/publications/84887236253
UR - http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=3
U2 - 10.1109/JQE.2013.2282759
DO - 10.1109/JQE.2013.2282759
M3 - Article
AN - SCOPUS:84887236253
SN - 0018-9197
VL - 49
SP - 990
EP - 996
JO - IEEE Journal of Quantum Electronics
JF - IEEE Journal of Quantum Electronics
IS - 11
M1 - 6605534
ER -