Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL

Nadir Ali Khan, Kevin Schires, Antonio Hurtado, Ian D. Henning, Michael J. Adams

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.

Original languageEnglish
Article number6605534
Pages (from-to)990-996
Number of pages7
JournalIEEE Journal of Quantum Electronics
Volume49
Issue number11
DOIs
Publication statusPublished - 13 Nov 2013

Keywords

  • linewidth enhancement factor
  • relaxation oscillation frequency (ROF)
  • semiconductor lasers
  • vertical-cavity surface-emitting lasers (VCSELs)

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