Mapping transient electric fields with picosecond electron bunches

Long Chen, Runze Li, Jie Chen, Pengfei Zhu, Feng Liu, Jianming Cao, Zheng-Ming Sheng, Jie Zhang

Research output: Contribution to journalArticle

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55 Downloads (Pure)

Abstract

Transient electric fields, which are an important but hardly explored parameter of laser plasmas, can now be diagnosed experimentally with combined ultrafast temporal resolution and field sensitivity, using femtosecond to picosecond electron or proton pulses as probes. However, poor spatial resolution poses great challenges to simultaneously recording both the global and local field features. Here, we present a direct 3D measurement of a transient electric field by time-resolved electron schlieren radiography with simultaneous 80-Êm spatial and 3.7-ps temporal resolutions, analyzed using an Abel inversion algorithm. The electric field here is built up at the front of an aluminum foil irradiated with a femtosecond laser pulse at 1.9 × 1012 W/cm2, where electrons are emitted at a speed of 4 × 106 m/s, resulting in a unique gpeak.valleyh transient electric field map with the field strength up to 105 V/m. Furthermore, time-resolved schlieren radiography with charged particle pulses should enable the mapping of various fast-evolving field structures including those found in plasma-based particle accelerators.

Original languageEnglish
Pages (from-to)14479-14483
Number of pages5
JournalProceedings of the National Academy of Sciences
Volume112
Issue number47
Early online date9 Nov 2015
DOIs
Publication statusPublished - 24 Nov 2015

Fingerprint

electric fields
radiography
temporal resolution
electrons
pulses
particle accelerators
laser plasmas
foils
field strength
charged particles
spatial resolution
recording
inversions
aluminum
protons
probes
lasers

Keywords

  • electron radiography
  • laser plasma
  • spatial resolution
  • temporal resolution
  • transient electric field

Cite this

Chen, L., Li, R., Chen, J., Zhu, P., Liu, F., Cao, J., ... Zhang, J. (2015). Mapping transient electric fields with picosecond electron bunches. Proceedings of the National Academy of Sciences , 112(47), 14479-14483. https://doi.org/10.1073/pnas.1518353112
Chen, Long ; Li, Runze ; Chen, Jie ; Zhu, Pengfei ; Liu, Feng ; Cao, Jianming ; Sheng, Zheng-Ming ; Zhang, Jie. / Mapping transient electric fields with picosecond electron bunches. In: Proceedings of the National Academy of Sciences . 2015 ; Vol. 112, No. 47. pp. 14479-14483.
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Mapping transient electric fields with picosecond electron bunches. / Chen, Long; Li, Runze; Chen, Jie; Zhu, Pengfei; Liu, Feng; Cao, Jianming; Sheng, Zheng-Ming; Zhang, Jie.

In: Proceedings of the National Academy of Sciences , Vol. 112, No. 47, 24.11.2015, p. 14479-14483.

Research output: Contribution to journalArticle

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