Luminescent properties of GaN thin films prepared by pulsed laser deposition

M. Cazzanelli*, C. Vinegoni, D. Cole, J. G. Lunney, P. G. Middleton, C. Trager-Cowan, K. P. O'Donnell, L. Pavesi

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)

Abstract

The luminescent properties of GaN thin films grown by pulsed laser deposition have been studied to understand the nature of the luminescent centres and the recombination dynamics. The films were grown on heated sapphire substrates using KrF excimer laser ablation of GaN in a reactive atmosphere of nitrogen. At low temperature the continuous wave (CW) blue luminescence of the samples grown shows two sharp lines attributed to excitonic recombination localized at extended defects. An analysis of the temperature dependence of photoluminescence (PL) lifetimes assess the relative contributions of radiative and non-radiative recombination in the centres responsible for these emissions. The measurement of room temperature nanosecond radiative lifetimes for these lines supports the excitonic attribution of the luminescence.

Original languageEnglish
Pages (from-to)137-140
Number of pages4
JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume59
Issue number1-3
DOIs
Publication statusPublished - 6 May 1999
EventProceedings of the 1998 Symposium L: on Nitrides and Related Wide Band Gap Materials (E-MRS Meeting) - Strasbourg
Duration: 16 Jun 199819 Jun 1998

Funding

Discussions with C. Wetzel are gratefully acknowledged. The work at Trinity College Dublin was supported by the EU under BRITE-EURAM project BRPR-CT96-0295 and by Forbairt, the Irish Science and Technology agency. The Italian section was supported by INFM and ‘Progetto Speciale’, University of Trento.

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