Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron radiation

K. P. O'Donnell; R. W. Martin; M. E. White; M. J. Tobin; J. F.W. Mosselmans; I. M. Watson; B. Damilano; N. Grandjean

doi:10.1557/PROC-639-G9.11

Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron radiation

K. P. O'Donnell, R. W. Martin, M. E. White, M. J. Tobin, J. F.W. Mosselmans, I. M. Watson, B. Damilano, N. Grandjean

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

The Daresbury synchrotron radiation source (SRS) provides bright, tunable x-rays for scattering and absorption probes of local structure. Scanning confocal microscopy and luminescence decay measurements employ the SRS in alternative ways, as a tunable luminescence excitation engine and as a source of weak, 160 ps pulses with a large pulse-topulse separation, respectively. This report first describes local atomic structure studies of InGaN epilayers by extended x-ray absorption fine structure (EXAFS). In addition, we report photoluminescence (PL) imaging, PL microspectroscopy and photoluminescence decay studies of various nitride samples, including tailored InGaN quantum wells and discs.

Original language	English
Pages (from-to)	G9.11.1-G9.11.6
Number of pages	6
Journal	MRS Online Proceedings Library
Volume	639
DOIs	https://doi.org/10.1557/PROC-639-G9.11
Publication status	Published - 2001

Keywords

InGaN epilayer
quantum well
quantum dot samples
synchrotron radiation

Access to Document

10.1557/PROC-639-G9.11

Cite this

@article{b75a3ecca6d24a53a834af884d2b89f4,

title = "Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron radiation",

abstract = "The Daresbury synchrotron radiation source (SRS) provides bright, tunable x-rays for scattering and absorption probes of local structure. Scanning confocal microscopy and luminescence decay measurements employ the SRS in alternative ways, as a tunable luminescence excitation engine and as a source of weak, 160 ps pulses with a large pulse-topulse separation, respectively. This report first describes local atomic structure studies of InGaN epilayers by extended x-ray absorption fine structure (EXAFS). In addition, we report photoluminescence (PL) imaging, PL microspectroscopy and photoluminescence decay studies of various nitride samples, including tailored InGaN quantum wells and discs.",

keywords = "InGaN epilayer , quantum well, quantum dot samples , synchrotron radiation",

author = "O'Donnell, {K. P.} and Martin, {R. W.} and White, {M. E.} and Tobin, {M. J.} and Mosselmans, {J. F.W.} and Watson, {I. M.} and B. Damilano and N. Grandjean",

year = "2001",

doi = "10.1557/PROC-639-G9.11",

language = "English",

volume = "639",

pages = "G9.11.1--G9.11.6",

journal = "MRS Online Proceedings Library ",

issn = "0272-9172",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron radiation

AU - O'Donnell, K. P.

AU - Martin, R. W.

AU - White, M. E.

AU - Tobin, M. J.

AU - Mosselmans, J. F.W.

AU - Watson, I. M.

AU - Damilano, B.

AU - Grandjean, N.

PY - 2001

Y1 - 2001

N2 - The Daresbury synchrotron radiation source (SRS) provides bright, tunable x-rays for scattering and absorption probes of local structure. Scanning confocal microscopy and luminescence decay measurements employ the SRS in alternative ways, as a tunable luminescence excitation engine and as a source of weak, 160 ps pulses with a large pulse-topulse separation, respectively. This report first describes local atomic structure studies of InGaN epilayers by extended x-ray absorption fine structure (EXAFS). In addition, we report photoluminescence (PL) imaging, PL microspectroscopy and photoluminescence decay studies of various nitride samples, including tailored InGaN quantum wells and discs.

AB - The Daresbury synchrotron radiation source (SRS) provides bright, tunable x-rays for scattering and absorption probes of local structure. Scanning confocal microscopy and luminescence decay measurements employ the SRS in alternative ways, as a tunable luminescence excitation engine and as a source of weak, 160 ps pulses with a large pulse-topulse separation, respectively. This report first describes local atomic structure studies of InGaN epilayers by extended x-ray absorption fine structure (EXAFS). In addition, we report photoluminescence (PL) imaging, PL microspectroscopy and photoluminescence decay studies of various nitride samples, including tailored InGaN quantum wells and discs.

KW - InGaN epilayer

KW - quantum well

KW - quantum dot samples

KW - synchrotron radiation

UR - http://www.scopus.com/inward/record.url?scp=85010749073&partnerID=8YFLogxK

U2 - 10.1557/PROC-639-G9.11

DO - 10.1557/PROC-639-G9.11

M3 - Article

SN - 0272-9172

VL - 639

SP - G9.11.1-G9.11.6

JO - MRS Online Proceedings Library

JF - MRS Online Proceedings Library

ER -

Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron radiation

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this