Luminescence and structural properties of InGaN epilayer, quantum well and quantum dot samples using synchrotron excitation

K. P. O'Donnell, R. W. Martin, M. E. White, M. J. Tobin, J. F.W. Mosselmans, I. M. Watson, B. Damilano, N. Grandjean

Research output: Contribution to journalArticlepeer-review

Abstract

The Daresbury synchrotron radiation source (SRS) provides bright, tunable x-rays for scattering and absorption probes of local structure. Scanning confocal microscopy and luminescence decay measurements employ the SRS in alternative ways, as a tunable luminescence excitation engine and as a source of weak, 160 ps pulses with a large pulse-to-pulse separation, respectively. This report this describes local atomic structure studies of InGaN epilayers by extended x-ray absorption fine structure (EXAFS). In addition, we report photoluminescence (PL) imaging, PL microspectroscopy and photoluminescence decay studies of various nitride samples, including tailored InGaN quantum wells and discs.

Original languageEnglish
Pages (from-to)G9.11.1-G9.11.6
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume639
DOIs
Publication statusPublished - 1 Jan 2001

Keywords

  • tunable x-rays
  • luminescence decay
  • tunable luminescence

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