Low cost structured-light based 3D surface reconstruction

Yijun Yan, Maher Assaad, Jaime Zabalza, Jinchang Ren, Huimin Zhao

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In an increasingly specialized industry with strong demands from end users, product quality plays a key role in industrial manufacturing, where the quality impact highly depends on the final product and its application. An important parameter for quality control is the surface finish of objects, essential for determining their technical suitability. Therefore, measuring the surface levelness can be critical to ensure that the finished material meets the design specifications. In this work, we propose an effective yet low-cost solution using out-of-theshelf components, which is based on the structured light principle for depth/3D measurements (line laser). By means of laser triangulation, this solution can provide rapid and accurate levelness measurements both in 1D profiles and 2D maps for a relatively wide range of sizes, materials and other conditions. The experimental evaluations show a satisfactory performance with a great trade-offbetween accuracy and cost, becoming not only a rapid but a cheap solution, making it ideal for quick inspections in diverse environments.

Original languageEnglish
Article number2
Number of pages11
JournalInternational Journal on Smart Sensing and Intelligent Systems
Issue number1
Publication statusPublished - 23 Apr 2019


  • 3D-surface reconstruction
  • levelness
  • line-laser
  • roughness
  • structured-light


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