Long term testing and analysis of dielectric samples under DC excitation

Edward   Corr; W. H. Siew; Weijia Zhao

Long term testing and analysis of dielectric samples under DC excitation

Edward Corr, W. H. Siew, Weijia Zhao

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

3 Citations (Scopus)

88 Downloads (Pure)

Abstract

This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.

Original language	English
Title of host publication	IEEE Electrical Insulation Conference (2016)
Publisher	IEEE
Number of pages	4
Publication status	Published - 20 Jun 2016
Event	IEEE Electrical Insulation Conference - Canada, Montreal, Canada Duration: 19 Jun 2016 → 22 Jun 2016

Conference

Conference	IEEE Electrical Insulation Conference
Country	Canada
City	Montreal
Period	19/06/16 → 22/06/16

Keywords

cable insulation
condition monitoring
HVDC transmission
partial discharges

Access to Document

Corr-etal-EIC2016-long-term-testing-analysis-dielectric-samples-under-DC-excitationAccepted author manuscript, 598 KB

Link to conference web site

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Projects

1 Finished

Doctoral training centre in wind energy systems

Leithead, B. & Infield, D.

EPSRC (Engineering and Physical Sciences Research Council)

1/10/09 → 31/03/18

Project: Research - Studentship

Cite this

Corr, E., Siew, W. H., & Zhao, W. (2016). Long term testing and analysis of dielectric samples under DC excitation. In IEEE Electrical Insulation Conference (2016) IEEE.

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abstract = "This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.",

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N2 - This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.

AB - This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.

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