Abstract
| Language | English |
|---|---|
| Title of host publication | IEEE Electrical Insulation Conference (2016) |
| Publisher | IEEE |
| Number of pages | 4 |
| Publication status | Published - 20 Jun 2016 |
| Event | IEEE Electrical Insulation Conference - Canada, Montreal, Canada Duration: 19 Jun 2016 → 22 Jun 2016 |
Conference
| Conference | IEEE Electrical Insulation Conference |
|---|---|
| Country | Canada |
| City | Montreal |
| Period | 19/06/16 → 22/06/16 |
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Keywords
- cable insulation
- condition monitoring
- HVDC transmission
- partial discharges
Cite this
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Long term testing and analysis of dielectric samples under DC excitation. / Corr, Edward ; Siew, W. H.; Zhao, Weijia.
IEEE Electrical Insulation Conference (2016). IEEE, 2016.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book
TY - GEN
T1 - Long term testing and analysis of dielectric samples under DC excitation
AU - Corr, Edward
AU - Siew, W. H.
AU - Zhao, Weijia
PY - 2016/6/20
Y1 - 2016/6/20
N2 - This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.
AB - This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.
KW - cable insulation
KW - condition monitoring
KW - HVDC transmission
KW - partial discharges
UR - http://sites.ieee.org/eic/
M3 - Conference contribution book
BT - IEEE Electrical Insulation Conference (2016)
PB - IEEE
ER -