Long term testing and analysis of dielectric samples under DC excitation

Edward Corr, W. H. Siew, Weijia Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

3 Citations (Scopus)
88 Downloads (Pure)

Abstract

This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.
Original languageEnglish
Title of host publicationIEEE Electrical Insulation Conference (2016)
PublisherIEEE
Number of pages4
Publication statusPublished - 20 Jun 2016
EventIEEE Electrical Insulation Conference - Canada, Montreal, Canada
Duration: 19 Jun 201622 Jun 2016

Conference

ConferenceIEEE Electrical Insulation Conference
CountryCanada
CityMontreal
Period19/06/1622/06/16

Keywords

  • cable insulation
  • condition monitoring
  • HVDC transmission
  • partial discharges

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    Cite this

    Corr, E., Siew, W. H., & Zhao, W. (2016). Long term testing and analysis of dielectric samples under DC excitation. In IEEE Electrical Insulation Conference (2016) IEEE.