Local three dimensional visualization of nanoparticle assemblies

Y. Chen, Z.Y. Li, J. Yuan, R.E. Palmer, J.P. Wilcoxon

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

High-angle annular dark-field (HAADF) imaging technique in the scanning transmission electron microscope has been exploited to study self-assembled multilayer structures of Au/Ag nanoparticles. The HAADF image intensity depends monotonically on the mass and thickness of the sample. Various film thickness between one to four monolayers can be easily distinguished by evaluating the contrast.
LanguageEnglish
Pages2885-2888
Number of pages3
JournalAdvanced Materials
Volume17
Issue number23
DOIs
Publication statusPublished - 2005

Fingerprint

Film thickness
Monolayers
Multilayers
Electron microscopes
Visualization
Nanoparticles
Scanning
Imaging techniques

Keywords

  • nanoparticles
  • metal
  • scanning transmission
  • electron microscopy
  • self-assembled materials
  • nanoscience

Cite this

Chen, Y., Li, Z. Y., Yuan, J., Palmer, R. E., & Wilcoxon, J. P. (2005). Local three dimensional visualization of nanoparticle assemblies. Advanced Materials, 17(23), 2885-2888. https://doi.org/10.1002/adma.200500977
Chen, Y. ; Li, Z.Y. ; Yuan, J. ; Palmer, R.E. ; Wilcoxon, J.P. / Local three dimensional visualization of nanoparticle assemblies. In: Advanced Materials. 2005 ; Vol. 17, No. 23. pp. 2885-2888.
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Chen, Y, Li, ZY, Yuan, J, Palmer, RE & Wilcoxon, JP 2005, 'Local three dimensional visualization of nanoparticle assemblies' Advanced Materials, vol. 17, no. 23, pp. 2885-2888. https://doi.org/10.1002/adma.200500977

Local three dimensional visualization of nanoparticle assemblies. / Chen, Y.; Li, Z.Y.; Yuan, J.; Palmer, R.E.; Wilcoxon, J.P.

In: Advanced Materials, Vol. 17, No. 23, 2005, p. 2885-2888.

Research output: Contribution to journalArticle

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