Abstract
Comparative Ga and In K-edge extended x-ray absorption fine structure studies provide the first direct evidence of an inequality of mean In-Ga and Ga-In next-nearest neighbor separations in InGaN alloys. The degree of inequality increases with decreasing InN fraction x in the range accessible to extended x-ray absorption fine structure analysis of alloys (0.9 <x <0.1). Its concurrence with an increase of luminescence efficiency in this composition range suggests that the breakdown of In/Ga randomness in InGaN is correlated with efficient radiative recombination in blue-green light emitting devices.
| Original language | English |
|---|---|
| Article number | 101908 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 89 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 4 Sept 2006 |
Keywords
- luminescence
- absorption
- InGaN alloys
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