Abstract
Comparative Ga and In K-edge extended x-ray absorption fine structure studies provide the first direct evidence of an inequality of mean In-Ga and Ga-In next-nearest neighbor separations in InGaN alloys. The degree of inequality increases with decreasing InN fraction x in the range accessible to extended x-ray absorption fine structure analysis of alloys (0.9 <x <0.1). Its concurrence with an increase of luminescence efficiency in this composition range suggests that the breakdown of In/Ga randomness in InGaN is correlated with efficient radiative recombination in blue-green light emitting devices.
Original language | English |
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Article number | 101908 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 89 |
Issue number | 10 |
DOIs | |
Publication status | Published - 4 Sep 2006 |
Keywords
- luminescence
- absorption
- InGaN alloys