Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment
- E. Pincik
- , H. Kobayashi
- , S. Jurecka
- , M. Jergel
- , H. Gleskova
- , M. Takahashi
- , R. Brunner
- , N. Fujiwara
- , J. Mullerova
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book