Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

E. Pincik, H. Kobayashi, S. Jurecka, M. Jergel , H. Gleskova, M. Takahashi, R. Brunner, N. Fujiwara, J. Mullerova

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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Physics & Astronomy