Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

E. Pincik, H. Kobayashi, S. Jurecka, M. Jergel , H. Gleskova, M. Takahashi, R. Brunner, N. Fujiwara, J. Mullerova

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

Abstract

This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment
LanguageEnglish
Title of host publicationProccedings of the fifth international conference on thin film physics and applications
EditorsJ. Chu, Z. Lai, L. Wang, S. Xu
Place of PublicationBellingham, WA
Pages481-488
Number of pages8
Volume5774
Publication statusPublished - 2004
EventFifth International Conference on Thin Film Physics and Applications - Shanghai, China
Duration: 31 May 20042 Jun 2004

Conference

ConferenceFifth International Conference on Thin Film Physics and Applications
CountryChina
CityShanghai
Period31/05/042/06/04

Fingerprint

cyanides
electrical properties
optical properties
oxides

Keywords

  • investigation
  • electrical
  • structural
  • optical properties
  • very thin oxide
  • cyanide treatment

Cite this

Pincik, E., Kobayashi, H., Jurecka, S., Jergel , M., Gleskova, H., Takahashi, M., ... Mullerova, J. (2004). Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In J. Chu, Z. Lai, L. Wang, & S. Xu (Eds.), Proccedings of the fifth international conference on thin film physics and applications (Vol. 5774, pp. 481-488). Bellingham, WA .
Pincik, E. ; Kobayashi, H. ; Jurecka, S. ; Jergel , M. ; Gleskova, H. ; Takahashi, M. ; Brunner, R. ; Fujiwara, N. ; Mullerova, J. / Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. Proccedings of the fifth international conference on thin film physics and applications. editor / J. Chu ; Z. Lai ; L. Wang ; S. Xu. Vol. 5774 Bellingham, WA , 2004. pp. 481-488
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title = "Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment",
abstract = "This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment",
keywords = "investigation, electrical, structural, optical properties, very thin oxide, cyanide treatment",
author = "E. Pincik and H. Kobayashi and S. Jurecka and M. Jergel and H. Gleskova and M. Takahashi and R. Brunner and N. Fujiwara and J. Mullerova",
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language = "English",
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Pincik, E, Kobayashi, H, Jurecka, S, Jergel , M, Gleskova, H, Takahashi, M, Brunner, R, Fujiwara, N & Mullerova, J 2004, Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. in J Chu, Z Lai, L Wang & S Xu (eds), Proccedings of the fifth international conference on thin film physics and applications. vol. 5774, Bellingham, WA , pp. 481-488, Fifth International Conference on Thin Film Physics and Applications, Shanghai, China, 31/05/04.

Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. / Pincik, E. ; Kobayashi, H.; Jurecka, S.; Jergel , M. ; Gleskova, H.; Takahashi, M. ; Brunner, R.; Fujiwara, N.; Mullerova, J.

Proccedings of the fifth international conference on thin film physics and applications. ed. / J. Chu; Z. Lai; L. Wang; S. Xu. Vol. 5774 Bellingham, WA , 2004. p. 481-488.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

TY - GEN

T1 - Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

AU - Pincik, E.

AU - Kobayashi, H.

AU - Jurecka, S.

AU - Jergel , M.

AU - Gleskova, H.

AU - Takahashi, M.

AU - Brunner, R.

AU - Fujiwara, N.

AU - Mullerova, J.

PY - 2004

Y1 - 2004

N2 - This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

AB - This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

KW - investigation

KW - electrical

KW - structural

KW - optical properties

KW - very thin oxide

KW - cyanide treatment

M3 - Conference contribution book

SN - 9780819457554

VL - 5774

SP - 481

EP - 488

BT - Proccedings of the fifth international conference on thin film physics and applications

A2 - Chu, J.

A2 - Lai, Z.

A2 - Wang, L.

A2 - Xu, S.

CY - Bellingham, WA

ER -

Pincik E, Kobayashi H, Jurecka S, Jergel M, Gleskova H, Takahashi M et al. Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In Chu J, Lai Z, Wang L, Xu S, editors, Proccedings of the fifth international conference on thin film physics and applications. Vol. 5774. Bellingham, WA . 2004. p. 481-488