Introduction - Journal of Microscopy

C. Trager-Cowan; A. Wilkinson

doi:10.1111/j.1365-2818.2008.01990.x

Introduction - Journal of Microscopy

Research output: Contribution to journal › Editorial › peer-review

Abstract

This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

Original language	English
Pages (from-to)	405-405
Number of pages	0
Journal	Journal of Microscopy
Volume	230
Issue number	3
DOIs	https://doi.org/10.1111/j.1365-2818.2008.01990.x
Publication status	Published - Jun 2008

Keywords

electron backscatter diffraction
diffraction

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@article{91eced7e23b44d28a43f26ac7c2196da,

title = "Introduction - Journal of Microscopy",

abstract = "This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.",

keywords = "electron backscatter diffraction, diffraction",

author = "C. Trager-Cowan and A. Wilkinson",

year = "2008",

month = jun,

doi = "10.1111/j.1365-2818.2008.01990.x",

language = "English",

volume = "230",

pages = "405--405",

journal = "Journal of Microscopy",

issn = "0022-2720",

number = "3",

}

TY - JOUR

T1 - Introduction - Journal of Microscopy

AU - Trager-Cowan, C.

AU - Wilkinson, A.

PY - 2008/6

Y1 - 2008/6

N2 - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

AB - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

KW - electron backscatter diffraction

KW - diffraction

U2 - 10.1111/j.1365-2818.2008.01990.x

DO - 10.1111/j.1365-2818.2008.01990.x

M3 - Editorial

VL - 230

SP - 405

EP - 405

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 3

ER -

Introduction - Journal of Microscopy

Abstract

Keywords

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