Abstract
This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.
| Original language | English |
|---|---|
| Pages (from-to) | 405-405 |
| Number of pages | 0 |
| Journal | Journal of Microscopy |
| Volume | 230 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Jun 2008 |
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Keywords
- electron backscatter diffraction
- diffraction
Cite this
Trager-Cowan, C., & Wilkinson, A. (2008). Introduction - Journal of Microscopy. Journal of Microscopy, 230(3), 405-405. https://doi.org/10.1111/j.1365-2818.2008.01990.x