Abstract
| Language | English |
|---|---|
| Pages | 405-405 |
| Number of pages | 0 |
| Journal | Journal of Microscopy |
| Volume | 230 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Jun 2008 |
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Keywords
- electron backscatter diffraction
- diffraction
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Introduction - Journal of Microscopy. / Trager-Cowan, C.; Wilkinson, A.
In: Journal of Microscopy, Vol. 230, No. 3, 06.2008, p. 405-405.Research output: Contribution to journal › Editorial
TY - JOUR
T1 - Introduction - Journal of Microscopy
AU - Trager-Cowan, C.
AU - Wilkinson, A.
PY - 2008/6
Y1 - 2008/6
N2 - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.
AB - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.
KW - electron backscatter diffraction
KW - diffraction
U2 - 10.1111/j.1365-2818.2008.01990.x
DO - 10.1111/j.1365-2818.2008.01990.x
M3 - Editorial
VL - 230
SP - 405
EP - 405
JO - Journal of Microscopy
T2 - Journal of Microscopy
JF - Journal of Microscopy
SN - 0022-2720
IS - 3
ER -