Introduction - Journal of Microscopy

C. Trager-Cowan, A. Wilkinson

Research output: Contribution to journalEditorial

Abstract

This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.
LanguageEnglish
Pages405-405
Number of pages0
JournalJournal of Microscopy
Volume230
Issue number3
DOIs
Publication statusPublished - Jun 2008

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Scotland
Microscopy
Electrons
Education

Keywords

  • electron backscatter diffraction
  • diffraction

Cite this

Trager-Cowan, C. ; Wilkinson, A. / Introduction - Journal of Microscopy. In: Journal of Microscopy. 2008 ; Vol. 230, No. 3. pp. 405-405.
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Introduction - Journal of Microscopy. / Trager-Cowan, C.; Wilkinson, A.

In: Journal of Microscopy, Vol. 230, No. 3, 06.2008, p. 405-405.

Research output: Contribution to journalEditorial

TY - JOUR

T1 - Introduction - Journal of Microscopy

AU - Trager-Cowan, C.

AU - Wilkinson, A.

PY - 2008/6

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N2 - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

AB - This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

KW - electron backscatter diffraction

KW - diffraction

U2 - 10.1111/j.1365-2818.2008.01990.x

DO - 10.1111/j.1365-2818.2008.01990.x

M3 - Editorial

VL - 230

SP - 405

EP - 405

JO - Journal of Microscopy

T2 - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

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