Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

Pawel Niewczas; Lukasz Dziuda; Grzegorz Fusiek; Andrew James Willshire; James McDonald; Graham Thursby; D. Harvey; Craig Michie

doi:10.1109/IMTC.2002.1007212

Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

Pawel Niewczas, Lukasz Dziuda, Grzegorz Fusiek, Andrew James Willshire, James McDonald, Graham Thursby, D. Harvey, Craig Michie

Electronic And Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

3 Citations (Scopus)

Abstract

In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.

Original language	English
Title of host publication	IMTC 2002
Subtitle of host publication	proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2
Place of Publication	New York
Publisher	IEEE
Pages	1677-1681
Number of pages	5
ISBN (Print)	0780372182
DOIs	https://doi.org/10.1109/IMTC.2002.1007212
Publication status	Published - 2002
Event	19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, Alaska, United States Duration: 21 May 2002 → …

Publication series

Name	IEEE instrumentation & measurement technology conference proceedings
Publisher	IEEE
ISSN (Print)	1091-5281

Conference

Conference	19th IEEE Instrumentation and Measurement Technology Conference
Country/Territory	United States
City	Anchorage, Alaska
Period	21/05/02 → …

Keywords

interrogation
extrinsic
Fabry-Perot
interferometric sensors
arrayed waveguide grating devices
arrayed waveguide gratings
strain measurement
solid state circuits
sensor systems
sensor arrays
optical waveguides
optical interferometry
optical fibers
light sources

Access to Document

10.1109/IMTC.2002.1007212

Cite this

Niewczas, P., Dziuda, L., Fusiek, G., Willshire, A. J., McDonald, J., Thursby, G., Harvey, D., & Michie, C. (2002). Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. In IMTC 2002: proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2 (pp. 1677-1681). (IEEE instrumentation & measurement technology conference proceedings ). IEEE. https://doi.org/10.1109/IMTC.2002.1007212

Niewczas, Pawel ; Dziuda, Lukasz ; Fusiek, Grzegorz et al. / Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. IMTC 2002: proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2 . New York : IEEE, 2002. pp. 1677-1681 (IEEE instrumentation & measurement technology conference proceedings ).

@inproceedings{b2397678a06c436ca29b8fb584e5805d,

title = "Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices",

abstract = "In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation. ",

keywords = "interrogation, extrinsic, Fabry-Perot, interferometric sensors, arrayed waveguide grating devices , arrayed waveguide gratings, strain measurement , solid state circuits , sensor systems , sensor arrays , optical waveguides , optical interferometry , optical fibers , light sources ",

author = "Pawel Niewczas and Lukasz Dziuda and Grzegorz Fusiek and Willshire, \{Andrew James\} and James McDonald and Graham Thursby and D. Harvey and Craig Michie",

year = "2002",

doi = "10.1109/IMTC.2002.1007212",

language = "English",

isbn = "0780372182 ",

series = "IEEE instrumentation \& measurement technology conference proceedings ",

publisher = "IEEE",

pages = "1677--1681",

booktitle = "IMTC 2002",

note = "19th IEEE Instrumentation and Measurement Technology Conference ; Conference date: 21-05-2002",

}

Niewczas, P, Dziuda, L, Fusiek, G, Willshire, AJ, McDonald, J, Thursby, G, Harvey, D & Michie, C 2002, Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. in IMTC 2002: proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2 . IEEE instrumentation & measurement technology conference proceedings , IEEE, New York, pp. 1677-1681, 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, Alaska, United States, 21/05/02. https://doi.org/10.1109/IMTC.2002.1007212

Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. / Niewczas, Pawel; Dziuda, Lukasz; Fusiek, Grzegorz et al.
IMTC 2002: proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2 . New York: IEEE, 2002. p. 1677-1681 (IEEE instrumentation & measurement technology conference proceedings ).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

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T1 - Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

AU - Niewczas, Pawel

AU - Dziuda, Lukasz

AU - Fusiek, Grzegorz

AU - Willshire, Andrew James

AU - McDonald, James

AU - Thursby, Graham

AU - Harvey, D.

AU - Michie, Craig

PY - 2002

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N2 - In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.

AB - In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.

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KW - Fabry-Perot

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KW - arrayed waveguide grating devices

KW - arrayed waveguide gratings

KW - strain measurement

KW - solid state circuits

KW - sensor systems

KW - sensor arrays

KW - optical waveguides

KW - optical interferometry

KW - optical fibers

KW - light sources

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DO - 10.1109/IMTC.2002.1007212

M3 - Conference contribution book

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BT - IMTC 2002

PB - IEEE

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T2 - 19th IEEE Instrumentation and Measurement Technology Conference

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ER -

Niewczas P, Dziuda L, Fusiek G, Willshire AJ, McDonald J, Thursby G et al. Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. In IMTC 2002: proceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2 . New York: IEEE. 2002. p. 1677-1681. (IEEE instrumentation & measurement technology conference proceedings ). doi: 10.1109/IMTC.2002.1007212

Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

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