Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

Pawel Niewczas, Lukasz Dziuda, Grzegorz Fusiek, Andrew James Willshire, James McDonald, Graham Thursby, D. Harvey, Craig Michie

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

3 Citations (Scopus)


In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.
Original languageEnglish
Title of host publicationIMTC 2002
Subtitle of host publicationproceedings of the 19th IEEE instrumentation and measurement technology conference volumes 1 & 2
Place of PublicationNew York
Number of pages5
ISBN (Print)0780372182
Publication statusPublished - 2002
Event19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, Alaska, United States
Duration: 21 May 2002 → …

Publication series

NameIEEE instrumentation & measurement technology conference proceedings
ISSN (Print)1091-5281


Conference19th IEEE Instrumentation and Measurement Technology Conference
Country/TerritoryUnited States
CityAnchorage, Alaska
Period21/05/02 → …


  • interrogation
  • extrinsic
  • Fabry-Perot
  • interferometric sensors
  • arrayed waveguide grating devices
  • arrayed waveguide gratings
  • strain measurement
  • solid state circuits
  • sensor systems
  • sensor arrays
  • optical waveguides
  • optical interferometry
  • optical fibers
  • light sources


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