Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

P. Niewczas, L. Dziuda, G. Fusiek, A.J. Willshire, J.R. McDonald, G.J. Thursby, D. Harvey, W.C. Michie

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.
Original languageEnglish
Pages (from-to)1092-1096
Number of pages4
JournalIEEE Transactions on Instrumentation and Measurement
Issue number8
Publication statusPublished - 2003


  • arrayed waveguide gratings
  • Fabry-Pérot sensors
  • strain sensors
  • sensors
  • electric systems

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