Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

P. Niewczas, L. Dziuda, G. Fusiek, A.J. Willshire, J.R. McDonald, G.J. Thursby, D. Harvey, W.C. Michie

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.
LanguageEnglish
Pages1092-1096
Number of pages4
JournalIEEE Transactions on Instrumentation and Measurement
Volume52
Issue number8
DOIs
Publication statusPublished - 2003

Fingerprint

Arrayed waveguide gratings
interrogation
gratings
waveguides
sensors
Sensors
curve fitting
Curve fitting
Light sources
Spectrometers
Optical fibers
light sources
optical fibers
spectrometers
broadband
solid state
evaluation
simulation

Keywords

  • arrayed waveguide gratings
  • Fabry-Pérot sensors
  • strain sensors
  • sensors
  • electric systems

Cite this

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title = "Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices",
abstract = "In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.",
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year = "2003",
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Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. / Niewczas, P.; Dziuda, L.; Fusiek, G.; Willshire, A.J.; McDonald, J.R.; Thursby, G.J.; Harvey, D.; Michie, W.C.

In: IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 8, 2003, p. 1092-1096.

Research output: Contribution to journalArticle

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T1 - Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

AU - Niewczas, P.

AU - Dziuda, L.

AU - Fusiek, G.

AU - Willshire, A.J.

AU - McDonald, J.R.

AU - Thursby, G.J.

AU - Harvey, D.

AU - Michie, W.C.

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AB - In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.

KW - arrayed waveguide gratings

KW - Fabry-Pérot sensors

KW - strain sensors

KW - sensors

KW - electric systems

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