Interference between second harmonic waves in an anodically grown cadmium sulphide thin film

L.E.A. Berlouis; A.W. Wark; F.R. Cruickshank; David Pugh; Pierre-Francois Brevet

doi:10.1016/S0013-4686(99)00240-6

Interference between second harmonic waves in an anodically grown cadmium sulphide thin film

L.E.A. Berlouis, A.W. Wark, F.R. Cruickshank, David Pugh, Pierre-Francois Brevet

Pure And Applied Chemistry

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.

Original language	English
Pages (from-to)	623-628
Number of pages	6
Journal	Electrochimica Acta
Volume	45
Issue number	4-5
DOIs	https://doi.org/10.1016/S0013-4686(99)00240-6
Publication status	Published - Nov 1999

Keywords

CdS thin films
interference
second harmonic waves
anodically grown
cadmium sulphide thin film

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10.1016/S0013-4686(99)00240-6

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title = "Interference between second harmonic waves in an anodically grown cadmium sulphide thin film",

abstract = "Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.",

keywords = "CdS thin films, interference, second harmonic waves, anodically grown, cadmium sulphide thin film",

author = "L.E.A. Berlouis and A.W. Wark and F.R. Cruickshank and David Pugh and Pierre-Francois Brevet",

year = "1999",

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doi = "10.1016/S0013-4686(99)00240-6",

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journal = "Electrochimica Acta",

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TY - JOUR

T1 - Interference between second harmonic waves in an anodically grown cadmium sulphide thin film

AU - Berlouis, L.E.A.

AU - Wark, A.W.

AU - Cruickshank, F.R.

AU - Pugh, David

AU - Brevet, Pierre-Francois

PY - 1999/11

Y1 - 1999/11

N2 - Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.

AB - Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.

KW - CdS thin films

KW - interference

KW - second harmonic waves

KW - anodically grown

KW - cadmium sulphide thin film

U2 - 10.1016/S0013-4686(99)00240-6

DO - 10.1016/S0013-4686(99)00240-6

M3 - Article

SN - 0013-4686

VL - 45

SP - 623

EP - 628

JO - Electrochimica Acta

JF - Electrochimica Acta

IS - 4-5

ER -

Interference between second harmonic waves in an anodically grown cadmium sulphide thin film

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Keywords

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