Interference between second harmonic waves in an anodically grown cadmium sulphide thin film

L.E.A. Berlouis, A.W. Wark, F.R. Cruickshank, David Pugh, Pierre-Francois Brevet

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.
LanguageEnglish
Pages623-628
Number of pages6
JournalElectrochimica Acta
Volume45
Issue number4-5
DOIs
Publication statusPublished - Nov 1999

Fingerprint

Cadmium sulfide
Observation
Thin films
Anisotropy
Sulfides
Growth
Harmonic generation
Film thickness
cadmium sulfide
Substrates

Keywords

  • CdS thin films
  • interference
  • second harmonic waves
  • anodically grown
  • cadmium sulphide thin film

Cite this

Berlouis, L.E.A. ; Wark, A.W. ; Cruickshank, F.R. ; Pugh, David ; Brevet, Pierre-Francois. / Interference between second harmonic waves in an anodically grown cadmium sulphide thin film. In: Electrochimica Acta. 1999 ; Vol. 45, No. 4-5. pp. 623-628.
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Interference between second harmonic waves in an anodically grown cadmium sulphide thin film. / Berlouis, L.E.A.; Wark, A.W.; Cruickshank, F.R.; Pugh, David; Brevet, Pierre-Francois.

In: Electrochimica Acta, Vol. 45, No. 4-5, 11.1999, p. 623-628.

Research output: Contribution to journalArticle

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AU - Wark, A.W.

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AB - Second harmonic generation has been employed in-situ to follow the growth of a thin anodic sulphide film on CdxHg1−xTe (CMT). The anisotropy patterns recorded for the bare CMT surface show that the sample is a vicinal {100} face. This is supported in particular by the observation of a non-vanishing pattern in the SIN–SOUT configuration. Also, the observation of a four-fold pattern in the case of the CdS film confirms that the film has retained the ccp structure of the underlying CMT substrate. The SH signal recorded during the growth of the CdS film follows an oscillatory pattern with film thickness. This has been attributed to the interference between the two dominating SH waves generated within the CdS film.

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