Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator

Pierre Pottier, Michael J. Strain, Muthukumaran Packirisamy

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Abstract

An on-chip micro-spectrometer is demonstrated based on a circular diffraction grating consisting of an elliptical Bragg mirror. This structure results in a highly efficient and compact device with simplified processing requirements, useful for sensing, spectroscopy, telecom demultiplexing, and optical interconnects. The computed efficiency for a realistic geometry is 0.14 dB, which represents to the best of our knowledge the highest predicted efficiency for concave diffraction gratings (echelle/echelette gratings). The first realization of the elliptical Bragg mirror diffraction grating spectrometer is presented on silicon on insulator at a wavelength of 1.55 µm. Measurements show a full device efficiency of 3.0 dB, including all in-line losses, with a band flatness of 0.4 dB over 30 nm.
Original languageEnglish
Pages (from-to)430–436
Number of pages7
JournalACS Photonics
Volume1
Issue number5
DOIs
Publication statusPublished - 21 May 2014

Keywords

  • planar spectrometer
  • diffraction gratings
  • Bragg mirror
  • optical design
  • integrated optics

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