Abstract
In this paper, a fully post-growth device grating geometry based on etched sidewall gratings is presented. The grating is written on a ridge waveguide with the grating recess depth, d, and the waveguide width, W, being design parameters. The grating coupling coefficient, k, and Bragg condition are necessarily related to the grating design parameters through the overlap of the propagating mode with the grating cross section. By using the waveguide width and grating recess depth to control the grating parameters the structure may be written with a single longitudinal period, and therefore does not require extremely involved lithographic techniques to induce the wavelength chirp.
Original language | English |
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Number of pages | 1 |
DOIs | |
Publication status | Published - 1 Jan 2009 |
Event | CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference - Munich, Germany Duration: 14 Jun 2009 → 19 Jun 2009 |
Conference
Conference | CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference |
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Country/Territory | Germany |
City | Munich |
Period | 14/06/09 → 19/06/09 |
Keywords
- complex reflectivity
- integrated
- chirped bragg grating