A sample slide (100) for use in a spectrometer (501), wherein the sample slide comprises a plurality of sample-receiving portions (111-114) provided on a sample side (115) of the slide, and a plurality of beam-receiving portions (121-124) provided on a beam-receiving side (125) of the slide, each beam-receiving portion being arranged opposite a respective sample-receiving portion, and wherein each beam-receiving portion is configured to act as an internal reflection element (IRE). A device (300) for use with a spectrometer (501) comprises a stage (330) configured to receive a sample slide (100); and a moving mechanism (360) configured to move the sample slide relative to a sample-measuring location (320) of the device. Associated methods for preparing a sample and measuring a sample are also disclosed.
|Publication status||Published - 4 Jan 2022|
- spectroscopic analysis
- infra-red light
- ATR-FTIR spectroscopy analysis
- Fourier Transform Infrared (FTIR) spectroscopy