Influence of flexoelectricity above the nematic Freedericksz transition

C.V. Brown, N. Mottram

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

Continuum theory is used to demonstrate that the presence of flexoelectricity significantly alters the response to an applied voltage of a homogeneous nematic liquid crystal cell above the ac Fræ#169;edericksz threshold voltage. In such a system there is a fitting degeneracy: we obtain very good fits between theory and experimental permittivity data using any value of the sum of flexoelectric coefficients, e11 + e33, between 0.0 C/m and 1.5×10-11 C/m. The corresponding values of the nematic bend elastic constant show an inverse parabolic relationship with e11 + e33, with K33 being reduced down to 90% of its value when flexoelectricity is neglected.

Fingerprint

threshold voltage
elastic properties
Voltage
liquid crystals
permittivity
continuums
Elastic Constants
electric potential
Permittivity
Nematic Liquid Crystal
coefficients
cells
Degeneracy
Continuum
Cell
Coefficient
Demonstrate
Influence
Relationships

Keywords

  • continuum theory
  • flexoelectricity
  • nematic
  • Fréedericksz transition
  • mathematics
  • physics

Cite this

@article{fa52aa2abc3549e1a0fc37399270fffc,
title = "Influence of flexoelectricity above the nematic Freedericksz transition",
abstract = "Continuum theory is used to demonstrate that the presence of flexoelectricity significantly alters the response to an applied voltage of a homogeneous nematic liquid crystal cell above the ac Fr{\ae}#169;edericksz threshold voltage. In such a system there is a fitting degeneracy: we obtain very good fits between theory and experimental permittivity data using any value of the sum of flexoelectric coefficients, e11 + e33, between 0.0 C/m and 1.5×10-11 C/m. The corresponding values of the nematic bend elastic constant show an inverse parabolic relationship with e11 + e33, with K33 being reduced down to 90{\%} of its value when flexoelectricity is neglected.",
keywords = "continuum theory, flexoelectricity, nematic, Fr{\'e}edericksz transition, mathematics, physics",
author = "C.V. Brown and N. Mottram",
year = "2003",
doi = "10.1103/PhysRevE.68.031702",
language = "English",
volume = "68",
journal = "Physical Review E",
issn = "1539-3755",
publisher = "American Physical Society",

}

TY - JOUR

T1 - Influence of flexoelectricity above the nematic Freedericksz transition

AU - Brown, C.V.

AU - Mottram, N.

PY - 2003

Y1 - 2003

N2 - Continuum theory is used to demonstrate that the presence of flexoelectricity significantly alters the response to an applied voltage of a homogeneous nematic liquid crystal cell above the ac Fræ#169;edericksz threshold voltage. In such a system there is a fitting degeneracy: we obtain very good fits between theory and experimental permittivity data using any value of the sum of flexoelectric coefficients, e11 + e33, between 0.0 C/m and 1.5×10-11 C/m. The corresponding values of the nematic bend elastic constant show an inverse parabolic relationship with e11 + e33, with K33 being reduced down to 90% of its value when flexoelectricity is neglected.

AB - Continuum theory is used to demonstrate that the presence of flexoelectricity significantly alters the response to an applied voltage of a homogeneous nematic liquid crystal cell above the ac Fræ#169;edericksz threshold voltage. In such a system there is a fitting degeneracy: we obtain very good fits between theory and experimental permittivity data using any value of the sum of flexoelectric coefficients, e11 + e33, between 0.0 C/m and 1.5×10-11 C/m. The corresponding values of the nematic bend elastic constant show an inverse parabolic relationship with e11 + e33, with K33 being reduced down to 90% of its value when flexoelectricity is neglected.

KW - continuum theory

KW - flexoelectricity

KW - nematic

KW - Fréedericksz transition

KW - mathematics

KW - physics

UR - http://dx.doi.org/10.1103/PhysRevE.68.031702

U2 - 10.1103/PhysRevE.68.031702

DO - 10.1103/PhysRevE.68.031702

M3 - Article

VL - 68

JO - Physical Review E

T2 - Physical Review E

JF - Physical Review E

SN - 1539-3755

ER -