Inductive imaging of the concealed defects with radio-frequency atomic magnetometers

P. Bevington, R. Gartman, W. Chalupczak

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Abstract

We explore the capabilities of the radio-frequency atomic magnetometers in the non-destructive detection of concealed defects. We present results from the systematic magnetic inductive measurement of various defect types in an electrically conductive object at different rf field frequencies (0.4–12 kHz) that indicate the presence of an optimum operational frequency of the sensor. The optimum in the frequency dependence of the amplitude/phase contrast for defects under a 0.5–1.5 mm conductive barrier was observed within the 1–2 kHz frequency range. The experiments are performed in the self-compensated configuration that automatically removes the background signal created by the rf field producing object response.

Original languageEnglish
Article number6871
Number of pages14
JournalApplied Sciences (Switzerland)
Volume10
Issue number19
DOIs
Publication statusPublished - 30 Sep 2020

Keywords

  • atomic magnetometer
  • magnetic induction tomography
  • non-destructive testing

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