Abstract
This paper covers in-situ reflectometry studies of GaN growth initiation, inGaN structure growth, and ELOG. It was presented at the 2001 European workshop on metalorganic vapour phase epitaxy.
| Original language | English |
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| Publication status | Unpublished - 13 Jun 2001 |
| Event | European workshop on metalorganic vapour phase epitaxy - Wrexham, United Kingdom Duration: 10 Jun 2001 → 13 Jun 2001 |
Conference
| Conference | European workshop on metalorganic vapour phase epitaxy |
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| City | Wrexham, United Kingdom |
| Period | 10/06/01 → 13/06/01 |
Keywords
- reflectometry
- GaN
- growth initiation
- inGaN
- structure growth
- ELOG