In-situ reflectometry based studies of lateral epitaxial overgrowth

I.M. Watson, K.S. Kim, H.S. Kim, C. Liu, C.J. Deatcher, J.M. Girkin, M.D. Dawson, P.R. Edwards, C. Trager-Cowan, R.W. Martin

Research output: Contribution to conferencePaper

Abstract

This paper covers in-situ reflectometry based studies of lateral epitaxial overgrowth. It was presented at the 2001 UK Nitrides consortium.
Original languageEnglish
Publication statusUnpublished - Sep 2001
EventUK Nitrides Consortium Meeting - Glasgow, United Kingdom
Duration: 1 Sep 2001 → …

Conference

ConferenceUK Nitrides Consortium Meeting
CityGlasgow, United Kingdom
Period1/09/01 → …

Keywords

  • in-situ reflectometry
  • reflectometry
  • lateral epitaxial overgrowth

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