In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1-xTe

A.W. Wark, L.E.A. Berlouis, Fiona Jackson, S. Lochran, F.R. Cruickshank, Pierre-Francois Brevet

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Fingerprint

Dive into the research topics of 'In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1-xTe'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Medicine & Life Sciences