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In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1-xTe
A.W. Wark, L.E.A. Berlouis, Fiona Jackson, S. Lochran, F.R. Cruickshank, Pierre-Francois Brevet
Research output: Contribution to journal › Article › peer-review
9
Citations
(Scopus)