TY - JOUR
T1 - In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1-xTe
AU - Wark, A.W.
AU - Berlouis, L.E.A.
AU - Jackson, Fiona
AU - Lochran, S.
AU - Cruickshank, F.R.
AU - Brevet, Pierre-Francois
PY - 1997/9/30
Y1 - 1997/9/30
N2 - In-situ measurements of ellipsometry and second harmonic generation (SHG) are carried out to examine the growth of thin CdS films on CdxHg1−xTe (CMT) from aqueous sulphide solutions. The change in the extinction coefficient (at λ = 632.8 nm) with film thickness indicates that impurities, notably β-HgS, become increasingly incorporated in the CdS layer. The low value for the refractive index (n = 1.73) on the other hand suggests that the film is porous. In this first reported monitoring by SHG of the growth of a non-centrosymmetric layer on another such layer, we have observed an increase of the SH response as the CdS layer was grown. From first principles of non-linear optics, this increase should be quadratic with the film thickness. However, the observed increase does not depart clearly from a linear increase owing to the very thin CdS films grown. Anisotropy measurements have been performed prior to the growth and after the growth of the thin film. A clear change of the pattern attributed to the CdS film is observed but the SH response does not arise solely from the CdS film.
AB - In-situ measurements of ellipsometry and second harmonic generation (SHG) are carried out to examine the growth of thin CdS films on CdxHg1−xTe (CMT) from aqueous sulphide solutions. The change in the extinction coefficient (at λ = 632.8 nm) with film thickness indicates that impurities, notably β-HgS, become increasingly incorporated in the CdS layer. The low value for the refractive index (n = 1.73) on the other hand suggests that the film is porous. In this first reported monitoring by SHG of the growth of a non-centrosymmetric layer on another such layer, we have observed an increase of the SH response as the CdS layer was grown. From first principles of non-linear optics, this increase should be quadratic with the film thickness. However, the observed increase does not depart clearly from a linear increase owing to the very thin CdS films grown. Anisotropy measurements have been performed prior to the growth and after the growth of the thin film. A clear change of the pattern attributed to the CdS film is observed but the SH response does not arise solely from the CdS film.
KW - in-situ ellipsometry
KW - SHG measurements
KW - CdxHg1-xTe
KW - CdS layers
KW - growth
U2 - 10.1016/S0022-0728(97)00302-1
DO - 10.1016/S0022-0728(97)00302-1
M3 - Article
SN - 0022-0728
VL - 435
SP - 173
EP - 178
JO - Journal of Electroanalytical Chemistry
JF - Journal of Electroanalytical Chemistry
IS - 1-2
ER -