In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

A. Annoni; A. Melloni; M. J. Strain; M. Sorel; F. Morichetti

doi:10.1109/ICTON.2014.6876541

In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

A. Annoni, A. Melloni, M. J. Strain, M. Sorel, F. Morichetti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

Original language	English
Title of host publication	2014 16th International Conference on Transparent Optical Networks (ICTON)
Place of Publication	Piscataway, New Jersey
Publisher	IEEE
Number of pages	4
ISBN (Print)	9781479956005
DOIs	https://doi.org/10.1109/ICTON.2014.6876541
Publication status	Published - 2014
Event	16th International Conference on Transparent Optical Networks, ICTON 2014 - Graz, United Kingdom Duration: 6 Jul 2014 → 10 Jul 2014

Conference

Conference	16th International Conference on Transparent Optical Networks, ICTON 2014
Country/Territory	United Kingdom
City	Graz
Period	6/07/14 → 10/07/14

Keywords

delay-line interferometer
in-band optical signal-to-noise ratio (OSNR)
integrated optics devices
optical performance monitoring
silicon photonics

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10.1109/ICTON.2014.6876541

Cite this

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title = "In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip",

abstract = "A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy. ",

keywords = "delay-line interferometer, in-band optical signal-to-noise ratio (OSNR), integrated optics devices, optical performance monitoring, silicon photonics",

author = "A. Annoni and A. Melloni and Strain, \{M. J.\} and M. Sorel and F. Morichetti",

year = "2014",

doi = "10.1109/ICTON.2014.6876541",

language = "English",

isbn = "9781479956005",

booktitle = "2014 16th International Conference on Transparent Optical Networks (ICTON)",

publisher = "IEEE",

note = "16th International Conference on Transparent Optical Networks, ICTON 2014 ; Conference date: 06-07-2014 Through 10-07-2014",

}

Annoni, A, Melloni, A, Strain, MJ, Sorel, M & Morichetti, F 2014, In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip. in 2014 16th International Conference on Transparent Optical Networks (ICTON)., 6876541, IEEE, Piscataway, New Jersey, 16th International Conference on Transparent Optical Networks, ICTON 2014, Graz, United Kingdom, 6/07/14. https://doi.org/10.1109/ICTON.2014.6876541

TY - GEN

T1 - In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

AU - Annoni, A.

AU - Melloni, A.

AU - Strain, M. J.

AU - Sorel, M.

AU - Morichetti, F.

PY - 2014

Y1 - 2014

N2 - A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

AB - A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

KW - delay-line interferometer

KW - in-band optical signal-to-noise ratio (OSNR)

KW - integrated optics devices

KW - optical performance monitoring

KW - silicon photonics

UR - https://www.scopus.com/pages/publications/84906762064

U2 - 10.1109/ICTON.2014.6876541

DO - 10.1109/ICTON.2014.6876541

M3 - Conference contribution book

AN - SCOPUS:84906762064

SN - 9781479956005

BT - 2014 16th International Conference on Transparent Optical Networks (ICTON)

PB - IEEE

CY - Piscataway, New Jersey

T2 - 16th International Conference on Transparent Optical Networks, ICTON 2014

Y2 - 6 July 2014 through 10 July 2014

ER -

In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

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Keywords

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