Abstract
A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.
Original language | English |
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Title of host publication | 2014 16th International Conference on Transparent Optical Networks (ICTON) |
Place of Publication | Piscataway, New Jersey |
Publisher | IEEE |
Number of pages | 4 |
ISBN (Print) | 9781479956005 |
DOIs | |
Publication status | Published - 2014 |
Event | 16th International Conference on Transparent Optical Networks, ICTON 2014 - Graz, United Kingdom Duration: 6 Jul 2014 → 10 Jul 2014 |
Conference
Conference | 16th International Conference on Transparent Optical Networks, ICTON 2014 |
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Country/Territory | United Kingdom |
City | Graz |
Period | 6/07/14 → 10/07/14 |
Keywords
- delay-line interferometer
- in-band optical signal-to-noise ratio (OSNR)
- integrated optics devices
- optical performance monitoring
- silicon photonics