In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

A. Annoni, A. Melloni, M. J. Strain, M. Sorel, F. Morichetti

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy. 

Original languageEnglish
Title of host publication2014 16th International Conference on Transparent Optical Networks (ICTON)
Place of PublicationPiscataway, New Jersey
PublisherIEEE
Number of pages4
ISBN (Print)9781479956005
DOIs
Publication statusPublished - 2014
Event16th International Conference on Transparent Optical Networks, ICTON 2014 - Graz, United Kingdom
Duration: 6 Jul 201410 Jul 2014

Conference

Conference16th International Conference on Transparent Optical Networks, ICTON 2014
CountryUnited Kingdom
CityGraz
Period6/07/1410/07/14

Keywords

  • delay-line interferometer
  • in-band optical signal-to-noise ratio (OSNR)
  • integrated optics devices
  • optical performance monitoring
  • silicon photonics

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