Abstract
This paper details improvements in the design and fabrication of electrodes intended to function in the high temperature, corrosive environment of a molten salt. Previously reported devices have displayed low yield and lifetimes and this paper presents two strategies to improve these aspects of their performance. The first one involves reducing the critical area, which increased both the electrode yield and lifetimes. The second element utilised test structures, targeted at identifying failure mechanisms, which helped facilitate the materials/design modifications required to make the devices more robust.
Original language | English |
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Pages (from-to) | 192-200 |
Number of pages | 9 |
Journal | IEEE Transactions on Semiconductor Manufacturing |
Volume | 30 |
Issue number | 3 |
Early online date | 14 Jun 2017 |
DOIs | |
Publication status | Published - 31 Aug 2017 |
Keywords
- test structures
- microelectrodes
- molten salt
- LKE
- yield
- lifetime
- microfabrication