Improved sectioning in a slit scanning confocal microscope

V. Poher, G.T. Kennedy, H.B. Manning, D.M. Owen, H.X. Zhang, E. Gu, P.M.W. French, M.D. Dawson, M.A.A. Neil

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We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.
Original languageEnglish
Pages (from-to)1813-1815
Number of pages2
JournalOptics Letters
Issue number16
Publication statusPublished - 6 Aug 2008


  • Line scanning confocal microscope
  • axial resolution improvement
  • Physics
  • Photonics
  • Optics.

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