Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

G. Naresh-Kumar, David Thomson, Y. Zhang, J. Bai, L. Jiu, X. Yu, Y. P. Gong, Richard Smith Martin, Tao Wang, Carol Trager-Cowan

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

35 Downloads (Pure)

1 results

Finished
Manufacturing of nano-engineered III-nitride semiconductors
Martin, R. & Trager-Cowan, C.
EPSRC (Engineering and Physical Sciences Research Council)
1/05/15 → 30/09/21
Project: Research