Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

G. Naresh-Kumar, David Thomson, Y. Zhang, J. Bai, L. Jiu, X. Yu, Y. P. Gong, Richard Smith Martin, Tao Wang, Carol Trager-Cowan

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)
35 Downloads (Pure)

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