Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

G. Naresh-Kumar, David Thomson, Y. Zhang, J. Bai, L. Jiu, X. Yu, Y. P. Gong, Richard Smith Martin, Tao Wang, Carol Trager-Cowan

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

35 Downloads (Pure)

Data for: Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging
Gunasekar, N. (Creator), Thomson, D. (Contributor), zhang (Contributor), Bai, J. (Contributor), Jiu, L. (Contributor), Yu, X. (Contributor), Gong, Y. P. (Contributor), Smith, R. M. (Contributor), Wang, T. (Contributor) & Trager-Cowan, C. (Contributor), University of Strathclyde, 25 Jul 2018
DOI: 10.15129/08835339-a263-4dab-a4dd-d0119dfe5ac8
Dataset

Datasets