Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

G. Naresh-Kumar, Benjamin Hourahine, A. Vilalta-Clemente, P. Ruterana, P. Gamarra, C. Lacam, M. Tordjman, M. A. di Forte-Poisson, P. J. Parbrook, A. P. Day, G. England, Carol Trager-Cowan

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18 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds