Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis

Nur Hakimah Binti Ab Aziz; Martin Judd; Victoria Catterson

doi:10.1109/ICSD.2013.6619720

Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis

Nur Hakimah Binti Ab Aziz, Martin Judd, Victoria Catterson

Electronic And Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

5 Citations (Scopus)

276 Downloads (Pure)

Abstract

This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.

Original language	English
Title of host publication	11th IEEE International Conference on Solid Dielectrics (ICSD)
Place of Publication	New York
Publisher	IEEE
Pages	152-155
Number of pages	4
ISBN (Print)	9781479908073
DOIs	https://doi.org/10.1109/ICSD.2013.6619720
Publication status	Published - Jun 2013
Event	2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna , Italy Duration: 30 Jun 2013 → 4 Jul 2013

Conference

Conference	2013 IEEE International Conference on Solid Dielectrics (ICSD)
Country/Territory	Italy
City	Bologna
Period	30/06/13 → 4/07/13

Keywords

prognostic indicators
electrical treeing
solid insulation

Access to Document

10.1109/ICSD.2013.6619720

ICSD Final PreprintSubmitted manuscript, 527 KB

Cite this

@inproceedings{66d5d834a8754131a1656d6fa92c0aa9,

title = "Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis",

abstract = "This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.",

keywords = "prognostic indicators , electrical treeing, solid insulation",

author = "{Binti Ab Aziz}, {Nur Hakimah} and Martin Judd and Victoria Catterson",

year = "2013",

month = jun,

doi = "10.1109/ICSD.2013.6619720",

language = "English",

isbn = "9781479908073 ",

pages = "152--155",

booktitle = "11th IEEE International Conference on Solid Dielectrics (ICSD)",

publisher = "IEEE",

note = "2013 IEEE International Conference on Solid Dielectrics (ICSD) ; Conference date: 30-06-2013 Through 04-07-2013",

}

Binti Ab Aziz, NH, Judd, M & Catterson, V 2013, Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. in 11th IEEE International Conference on Solid Dielectrics (ICSD). IEEE, New York, pp. 152-155, 2013 IEEE International Conference on Solid Dielectrics (ICSD), Bologna , Italy, 30/06/13. https://doi.org/10.1109/ICSD.2013.6619720

TY - GEN

T1 - Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis

AU - Binti Ab Aziz, Nur Hakimah

AU - Judd, Martin

AU - Catterson, Victoria

PY - 2013/6

Y1 - 2013/6

N2 - This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.

AB - This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.

KW - prognostic indicators

KW - electrical treeing

KW - solid insulation

U2 - 10.1109/ICSD.2013.6619720

DO - 10.1109/ICSD.2013.6619720

M3 - Conference contribution book

SN - 9781479908073

SP - 152

EP - 155

BT - 11th IEEE International Conference on Solid Dielectrics (ICSD)

PB - IEEE

CY - New York

T2 - 2013 IEEE International Conference on Solid Dielectrics (ICSD)

Y2 - 30 June 2013 through 4 July 2013

ER -

Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis

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Keywords

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