Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis

Nur Hakimah Binti Ab Aziz, Martin Judd, Victoria Catterson

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

3 Citations (Scopus)

Abstract

This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.
LanguageEnglish
Title of host publication11th IEEE International Conference on Solid Dielectrics (ICSD)
Place of PublicationNew York
PublisherIEEE
Pages152-155
Number of pages4
ISBN (Print)9781479908073
DOIs
Publication statusPublished - Jun 2013
Event2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna , Italy
Duration: 30 Jun 20134 Jul 2013

Conference

Conference2013 IEEE International Conference on Solid Dielectrics (ICSD)
CountryItaly
CityBologna
Period30/06/134/07/13

Fingerprint

Partial discharges
Insulation
Needles
Silicones
Microscopes
Sensors

Keywords

  • prognostic indicators
  • electrical treeing
  • solid insulation

Cite this

Binti Ab Aziz, N. H., Judd, M., & Catterson, V. (2013). Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. In 11th IEEE International Conference on Solid Dielectrics (ICSD) (pp. 152-155). New York: IEEE. https://doi.org/10.1109/ICSD.2013.6619720
Binti Ab Aziz, Nur Hakimah ; Judd, Martin ; Catterson, Victoria. / Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. 11th IEEE International Conference on Solid Dielectrics (ICSD). New York : IEEE, 2013. pp. 152-155
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Binti Ab Aziz, NH, Judd, M & Catterson, V 2013, Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. in 11th IEEE International Conference on Solid Dielectrics (ICSD). IEEE, New York, pp. 152-155, 2013 IEEE International Conference on Solid Dielectrics (ICSD), Bologna , Italy, 30/06/13. https://doi.org/10.1109/ICSD.2013.6619720

Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. / Binti Ab Aziz, Nur Hakimah; Judd, Martin; Catterson, Victoria.

11th IEEE International Conference on Solid Dielectrics (ICSD). New York : IEEE, 2013. p. 152-155.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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N2 - This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.

AB - This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.

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Binti Ab Aziz NH, Judd M, Catterson V. Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. In 11th IEEE International Conference on Solid Dielectrics (ICSD). New York: IEEE. 2013. p. 152-155 https://doi.org/10.1109/ICSD.2013.6619720