We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.
|Title of host publication||Advanced Photonics 2013|
|Subtitle of host publication||Integrated Photonics Research, Silicon and Nanophotonics|
|Publisher||Optical Society of America|
|Publication status||Published - 1 Dec 2013|
- integrated optics devices
- photonic integrated circuits
Morichetti, F., Annoni, A., Sharma, R. V., Strain, M. J., Sorel, M., & Melloni, A. (2013). High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In Advanced Photonics 2013: Integrated Photonics Research, Silicon and Nanophotonics [IW5A.2] Optical Society of America. https://doi.org/10.1364/IPRSN.2013.IW5A.2