High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Francesco Morichetti; Andrea Annoni; Ritu V. Sharma; Michael John Strain; Marc Sorel; Andrea  Melloni

doi:10.1364/IPRSN.2013.IW5A.2

High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Francesco Morichetti, Andrea Annoni, Ritu V. Sharma, Michael John Strain, Marc Sorel, Andrea Melloni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

Original language	English
Title of host publication	Advanced Photonics 2013
Subtitle of host publication	Integrated Photonics Research, Silicon and Nanophotonics
Publisher	Optical Society of America
ISBN (Print)	9781557529817
DOIs	https://doi.org/10.1364/IPRSN.2013.IW5A.2
Publication status	Published - 1 Dec 2013

Keywords

integrated optics devices
photonic integrated circuits
interferometry
optoelectronics

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10.1364/IPRSN.2013.IW5A.2

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title = "High-sensitivity in-band OSNR monitoring on a silicon photonics platform",

abstract = "We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy. ",

keywords = "integrated optics devices, photonic integrated circuits, interferometry, optoelectronics",

author = "Francesco Morichetti and Andrea Annoni and Sharma, {Ritu V.} and Strain, {Michael John} and Marc Sorel and Andrea Melloni",

year = "2013",

month = dec,

day = "1",

doi = "10.1364/IPRSN.2013.IW5A.2",

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T1 - High-sensitivity in-band OSNR monitoring on a silicon photonics platform

AU - Morichetti, Francesco

AU - Annoni, Andrea

AU - Sharma, Ritu V.

AU - Strain, Michael John

AU - Sorel, Marc

AU - Melloni, Andrea

PY - 2013/12/1

Y1 - 2013/12/1

N2 - We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

AB - We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

KW - integrated optics devices

KW - photonic integrated circuits

KW - interferometry

KW - optoelectronics

UR - http://www.scopus.com/inward/record.url?scp=84898074720&partnerID=8YFLogxK

U2 - 10.1364/IPRSN.2013.IW5A.2

DO - 10.1364/IPRSN.2013.IW5A.2

M3 - Conference contribution book

SN - 9781557529817

BT - Advanced Photonics 2013

PB - Optical Society of America

ER -

High-sensitivity in-band OSNR monitoring on a silicon photonics platform

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