High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Francesco Morichetti, Andrea Annoni, Ritu V. Sharma, Michael John Strain, Marc Sorel, Andrea Melloni

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.
Original languageEnglish
Title of host publicationAdvanced Photonics 2013
Subtitle of host publicationIntegrated Photonics Research, Silicon and Nanophotonics
PublisherOptical Society of America
ISBN (Print)9781557529817
DOIs
Publication statusPublished - 1 Dec 2013

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Keywords

  • integrated optics devices
  • photonic integrated circuits
  • interferometry
  • optoelectronics

Cite this

Morichetti, F., Annoni, A., Sharma, R. V., Strain, M. J., Sorel, M., & Melloni, A. (2013). High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In Advanced Photonics 2013: Integrated Photonics Research, Silicon and Nanophotonics [IW5A.2] Optical Society of America. https://doi.org/10.1364/IPRSN.2013.IW5A.2