High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing

K. Prasai, J. Jiang, A. Mishkin, B. Shyam, S. Angelova, R. Birney, D. A. Drabold, M. Fazio, E. K. Gustafson, G. Harry, S. Hoback, J. Hough, C. Lévesque, I. MacLaren, A. Markosyan, I. W. Martin, C. S. Menoni, P. G. Murray, S. Penn, S. ReidR. Robie, S. Rowan, F. Schiettekatte, R. Shink, A. Turner, G. Vajente, H-P. Cheng, M. M. Fejer, A. Mehta, R. Bassiri

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