High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis

Niall Oswald, Bernard Stark, Neville McNeill, Derrick Holliday, Neville McNeill

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

9 Citations (Scopus)

Abstract

The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and high-pass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers high-fidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.
LanguageEnglish
Title of host publication2011 IEEE energy conversion congress and exposition (ECCE)
Place of PublicationNew York
PublisherIEEE
Pages3886-3893
Number of pages8
ISBN (Print)9781457705410
DOIs
Publication statusPublished - Sep 2011
Event2011 IEEE Energy Conversion Congress and Exposition (ECCE) - Phoenix, United States
Duration: 17 Sep 201122 Sep 2011

Conference

Conference2011 IEEE Energy Conversion Congress and Exposition (ECCE)
CountryUnited States
CityPhoenix
Period17/09/1122/09/11

Fingerprint

waveforms
bandwidth
electronics
accumulators
power converters
probes
electric potential
high voltages
emitters
gradients
predictions
simulation

Keywords

  • power electronics
  • EMI
  • high-bandwidth
  • high-fidelity
  • in-circuit measurement
  • power electronic
  • switching waveforms
  • emi generation analysis

Cite this

Oswald, N., Stark, B., McNeill, N., Holliday, D., & McNeill, N. (2011). High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. In 2011 IEEE energy conversion congress and exposition (ECCE) (pp. 3886-3893). New York: IEEE. https://doi.org/10.1109/ECCE.2011.6064297
Oswald, Niall ; Stark, Bernard ; McNeill, Neville ; Holliday, Derrick ; McNeill, Neville. / High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. 2011 IEEE energy conversion congress and exposition (ECCE) . New York : IEEE, 2011. pp. 3886-3893
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title = "High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis",
abstract = "The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and high-pass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers high-fidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.",
keywords = "power electronics, EMI, high-bandwidth, high-fidelity , in-circuit measurement, power electronic , switching waveforms, emi generation analysis",
author = "Niall Oswald and Bernard Stark and Neville McNeill and Derrick Holliday and Neville McNeill",
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doi = "10.1109/ECCE.2011.6064297",
language = "English",
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Oswald, N, Stark, B, McNeill, N, Holliday, D & McNeill, N 2011, High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. in 2011 IEEE energy conversion congress and exposition (ECCE) . IEEE, New York, pp. 3886-3893, 2011 IEEE Energy Conversion Congress and Exposition (ECCE), Phoenix, United States, 17/09/11. https://doi.org/10.1109/ECCE.2011.6064297

High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. / Oswald, Niall; Stark, Bernard; McNeill, Neville; Holliday, Derrick; McNeill, Neville.

2011 IEEE energy conversion congress and exposition (ECCE) . New York : IEEE, 2011. p. 3886-3893.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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AU - Holliday, Derrick

AU - McNeill, Neville

PY - 2011/9

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N2 - The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and high-pass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers high-fidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.

AB - The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and high-pass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers high-fidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.

KW - power electronics

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M3 - Conference contribution book

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EP - 3893

BT - 2011 IEEE energy conversion congress and exposition (ECCE)

PB - IEEE

CY - New York

ER -

Oswald N, Stark B, McNeill N, Holliday D, McNeill N. High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. In 2011 IEEE energy conversion congress and exposition (ECCE) . New York: IEEE. 2011. p. 3886-3893 https://doi.org/10.1109/ECCE.2011.6064297