High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis

Niall Oswald, Bernard Stark, Neville McNeill, Derrick Holliday, Neville McNeill

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

9 Citations (Scopus)

Abstract

The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and high-pass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers high-fidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.
Original languageEnglish
Title of host publication2011 IEEE energy conversion congress and exposition (ECCE)
Place of PublicationNew York
PublisherIEEE
Pages3886-3893
Number of pages8
ISBN (Print)9781457705410
DOIs
Publication statusPublished - Sep 2011
Event2011 IEEE Energy Conversion Congress and Exposition (ECCE) - Phoenix, United States
Duration: 17 Sep 201122 Sep 2011

Conference

Conference2011 IEEE Energy Conversion Congress and Exposition (ECCE)
CountryUnited States
CityPhoenix
Period17/09/1122/09/11

Keywords

  • power electronics
  • EMI
  • high-bandwidth
  • high-fidelity
  • in-circuit measurement
  • power electronic
  • switching waveforms
  • emi generation analysis

Cite this

Oswald, N., Stark, B., McNeill, N., Holliday, D., & McNeill, N. (2011). High-bandwidth, high-fidelity in-circuit measurement of power electronic switching waveforms for EMI generation analysis. In 2011 IEEE energy conversion congress and exposition (ECCE) (pp. 3886-3893). IEEE. https://doi.org/10.1109/ECCE.2011.6064297