High quality, single phase c-axis oriented YBa2Cu3O7-α thin films with superconducting properties were grown by laser ablation on (001) SrTiO3 substrates. The surface morphology of the films has been investigated by means of high-pressure reflection high energy electron diffraction (RHEED), atomic force microscopy (AFM), and scanning electron microscopy (SEM), while the structural properties were studied by X-ray diffraction (XRD). Deposition under optimum conditions produces films with relatively smooth surface, with a roughness of about 10-15 nm, as confirmed by AFM and SEM data. The growth follows a Stransky-Krastanov mechanism governed by the substrate-film interface properties due to presence of epitaxial strain. The films show good superconducting properties with Tc values of 85-91 K. Results on the fabrication and electrical transport properties of ramp-type Josephson junctions with YBa2Cu3O7-α electrodes and PrBa2Cu3O7-α barrier are presented.
|Translated title of the contribution||Growth mechanism and properties of YBa2Cu3O7-αthin films deposited by laser ablation on (001) SrTiO3|
|Number of pages||5|
|Journal||Revista Romana de Materiale/ Romanian Journal of Materials|
|Publication status||Published - 1 Dec 2010|
- pulsed laser ablation
- ramp-type josephson junctions
- x-ray diffraction