Mecanism de creştere şi proprietǎţi ale filmelor subţiri de YBa2Cu3O7-αdepuse prin ablaţie laser PE (001) SrTiO3

Translated title of the contribution: Growth mechanism and properties of YBa2Cu3O7-αthin films deposited by laser ablation on (001) SrTiO3

Victor Leca, Dragoş Neagu, Elena Ştefan, Ecaterina Andronescu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


High quality, single phase c-axis oriented YBa2Cu3O7-α thin films with superconducting properties were grown by laser ablation on (001) SrTiO3 substrates. The surface morphology of the films has been investigated by means of high-pressure reflection high energy electron diffraction (RHEED), atomic force microscopy (AFM), and scanning electron microscopy (SEM), while the structural properties were studied by X-ray diffraction (XRD). Deposition under optimum conditions produces films with relatively smooth surface, with a roughness of about 10-15 nm, as confirmed by AFM and SEM data. The growth follows a Stransky-Krastanov mechanism governed by the substrate-film interface properties due to presence of epitaxial strain. The films show good superconducting properties with Tc values of 85-91 K. Results on the fabrication and electrical transport properties of ramp-type Josephson junctions with YBa2Cu3O7-α electrodes and PrBa2Cu3O7-α barrier are presented.

Translated title of the contributionGrowth mechanism and properties of YBa2Cu3O7-αthin films deposited by laser ablation on (001) SrTiO3
Original languageRomanian
Pages (from-to)365-369
Number of pages5
JournalRevista Romana de Materiale/ Romanian Journal of Materials
Issue number4
Publication statusPublished - 1 Dec 2010
Externally publishedYes


  • morphology
  • pulsed laser ablation
  • ramp-type josephson junctions
  • x-ray diffraction
  • YBaCuO


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