Abstract
The high-resolution electron backscatter diffraction (EBSD) was employed to study microstructure produced by cryogenic high-pressure torsion of copper. The long term (∼11 months) thermal stability of the obtained material at room temperature was also evaluated. It has been established that severe cryogenic deformation leads to a considerable grain refinement down to 0.3 μm. However the obtained material was shown to be quite unstable exhibiting abnormal grain growth at ambient temperature.
| Original language | English |
|---|---|
| Pages (from-to) | 31-35 |
| Number of pages | 5 |
| Journal | Reviews on Advanced Materials Science |
| Volume | 31 |
| Issue number | 1 |
| Publication status | Published - 2012 |
Keywords
- Grain refinement
- copper
- electron backscatter diffraction
- cryogenic deformation
- cryogenic high-pressure torsion
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Konkova, T. N., Mironov, S. Y., & Korznikov, A. V. (2012). Grain refinement in copper via cryogenic deformation. Reviews on Advanced Materials Science, 31(1), 31-35.